R&D: Reading Reliability Analysis and Modeling in 1S1R Devices Based on Phase-Change Memory and Ovonic Threshold Switching Selector Integrated in Double-Patterned Self-aligned Structure

*R&D: Reading Reliability Analysis and Modeling in 1S1R Devices Based on Phase-Change Memory and Ovonic Threshold Switching Selector Integrated in Double-Patterned Self-aligned Structure* ift.tt/cjdE7TN
Submitted June 24, 2025 at 03:16PM by NewMaxx via reddit ift.tt/ewa9mlb